X-ray Diffraction Solution for High Sample Throughput
The D4 ENDEAVOR is an X-ray Diffraction (XRD) Solution for the analysis of polycrystalline material by means of X-ray powder diffraction. The D4 ENDEAVOR performs qualitative and quantitative crystalline phase analysis, peak profile analysis, residual stress determination and structure solutions. As such it provides optimum performance forprocess and quality control in the aluminium, cement, chemistry, geology, pharmaceutical, and pigment industries.
Innovative 1-dimensional X-ray detectors
In addition to its proven accuracy, repeatability and reliability, the D4 ENDEAVOR features the modularity of the family of Bruker AXS Diffraction Solutions. The D4 ENDEAVOR can be equipped with innovative 1-dimensional X-ray detectors – LYNXEYE or VÅNTEC-1 – to provide an enormous reduction of measurement time per sample.